Presentation Description: Minimizing conduction loss by “overdriving” the JFET gate is easily understood. Prediction of peak current versus time and line energy absorption in the JFET are not well understood, yet these are just as critical to a commercially viable design. This presentation provides an overview of how to predict allowable peak current versus time and thus safely maximize energy in each JFET during emergency switching, explains two gate drive types, and explains temperature and current sensing using the JFET itself.
