D16.2 - Scattering Parameter Measurement System using Probes for Surface Mount Devices Operating in the Frequency Range from 50 kHz to 1 GHz

Thursday, March 20, 2025

11:30 AM – 1:30 PM ET

Location: Level One, Hall A3

Technical Dialogue Presenter(s)

Ryoko Kishikawa

National Institute of Advanced Industrial Science and Technology

Presentation Paper

Co-Author(s)

MH

Masahiro Horibe

National Institute of Advanced Industrial Science and Technology
TS

Tomokazu Shoji

T Plus Co. Ltd.
Shigenori Yabuta

T Plus Co. Ltd.
TO

Toshi Ohi

T Plus Co. Ltd.
Ryo Takeda, MSEE

Keysight Technologies
Takamasa Arai (he/him/his)

Keysight Technologies

This paper presents a calibration method of a new probe system for measuring the scattering parameters (S-parameters) of surface mount devices (SMDs) and measurement results using the system in the frequency range from 50 kHz to 1 GHz. The development addresses the strong demand for power devices operating at high-switching frequencies. Measuring the S-parameters of power devices, including the parasitic elements of the packages, is a prerequisite step in realizing the operations. Therefore, a probe with a pitch of 3.7 mm between the signal and ground tips and a probe station were manufactured as the original components. Using a commercially available vector network analyzer (VNA), a source/measure unit, and bias-tees in addition to the developed components, the S-parameters with a dc bias applied are conveniently measured. The advantage of the system is that the probes directly contact an SMD under test, and no test fixture for establishing a connection between an SMD under test and test port is necessary. Moreover, a single type of the probe can contact multiple types of SMDs under test. This is a pioneering measurement system for SMDs operated at radio frequencies.