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Technical Dialogue
Technical Dialogue Session

D07 - Power Devices & Components I

Thursday, March 20, 2025
11:30 AM – 1:30 PM ET
Location: Level One, Hall A3

Presentations:

  • 11:30 AM – 1:30 PM ET
    Influence of Threshold Voltage Temperature Dependency on Junction Temperature Imbalance in Paralleled SiC MOSFETs

    Technical Dialogue Presenter: Robert Roesner, Dr. Robert Roesner (he/him/his) – Infineon Technologies AG

    Co-Author: Andrea Piccioni, MSc. (he/him/his) – Infineon Technologies Austria

    Co-Author: Thomas Aichinger – Infineon

  • 11:30 AM – 1:30 PM ET
    A Dynamic Current Sharing Method using Novel Clip Considering Mutual Inductance Coupling

    Technical Dialogue Presenter: Zexiang Zheng – Huazhong University of Science and Technology

    Co-Author: Jianwei Lv – Huazhong University of Science and Technology

    Co-Author: Yiyang Yan, MA – HuaZhong University of Science and Technology

    Co-Author: Baihan Liu, PhD – Huazhong University of Science and Technology

    Co-Author: Linhao Ren (he/him/his) – Huazhong University of Science and Technology

    Co-Author: Jiaxin Liu – Huazhong University of Science and Technology

    Co-Author: Cai Chen – HuaZhong University of Science and Technology

    Co-Author: Yong Kang – HuaZhong University of Science and Technology

    Co-Author: Yifan Zhang (she/her/hers) – Huazhong University of Science and Technology

    Co-Author: Xiong Zhang – GAC Aion New Energy Automobile Co., Ltd.

    Co-Author: Hao Yu – GAC Aion New Energy Automobile Co., Ltd.

    Co-Author: Wei Jiang – GAC Aion New Energy Automobile Co., Ltd.

  • 11:30 AM – 1:30 PM ET
    Application-Oriented Test Setup for Measuring Dynamic Output and Transfer Characteristics of GaN-HEMTs

    Technical Dialogue Presenter: Philipp Swoboda – Karlsruhe Institute of Technology

    Co-Author: Martin Fein – Karlsruhe Institute of Technology

    Co-Author: Simon Frank – Karlsruhe Institute of Technology

    Co-Author: Andreas Liske – Karlsruhe Institute of Technology

    Co-Author: Marc Hiller – Karlsruhe Institute of Technology

  • 11:30 AM – 1:30 PM ET
    Mitigating Gate Voltage Oscillation in Parallel SiC Power Modules for xEV

    Technical Dialogue Presenter: Hideo Komo – Mitsubishi Electric US, Inc.

    Co-Author: Michael Rogers – Mitsubishi Electric US Inc.

    Co-Author: Mark Steiner – Mitsubishi Electric US

    Co-Author: Eric R. Motto – Mitsubishi Electric US Inc.

    Co-Author: Chihiro Kawahara – Mitsubishi Electric

    Co-Author: Junichi Nakashima – Mitsubishi Electric

    Co-Author: Yasushige Mukunoki – Mitsubishi Electric Corporation

    Co-Author: Seiichiro Inokuchi – Mitsubishi Electric

    Co-Author: Rei Yoneyama – Mitsubishi Electric

    Co-Author: Koichi Taguchi – Melco Semiconductor Engineering

  • 11:30 AM – 1:30 PM ET
    Switching Performance Comparison of Low-Voltage GaN and Si Devices

    Technical Dialogue Presenter: Tianxiao Chen (he/him/his) – Huawei Technologies Düsseldorf GmbH

    Co-Author: Haoyang Liu – Huawei Technologies Düsseldorf GmbH

    Co-Author: Pedro Andre Martins Bezerra – Huawei Technologies Düsseldorf GmbH

    Co-Author: Eckart Hoene – Fraunhofer IZM

    Co-Author: Sibylle Dieckerhoff – Technische Universitaet Berlin

  • 11:30 AM – 1:30 PM ET
    Modeling of Switching Transients for Frequency-Domain CM EMI Analysis in Double Sided Cooling Power Modules

    Technical Dialogue Presenter: Sijia Liu – School of Electrical and Electronic Engineering Huazhong University of Science and Technology

    Co-Author: Heng Zhang – School of Electrical and Electronic Engineering Huazhong University of Science and Technology

    Co-Author: Yifan Zhang (she/her/hers) – Huazhong University of Science and Technology

    Co-Author: Zexiang Zheng – Huazhong University of Science and Technology

    Co-Author: Jiaxin Liu – Huazhong University of Science and Technology

    Co-Author: Cai Chen – HuaZhong University of Science and Technology

    Co-Author: Yong Kang – HuaZhong University of Science and Technology

    Co-Author: Jianwei Lv – Huazhong University of Science and Technology

    Co-Author: Liu Yang – State Key Laboratory of HVDC

    Co-Author: Yuebin Zhou – State Key Laboratory of HVDC

    Co-Author: Daming Wang – State Key Laboratory of HVDC

    Co-Author: Shuang Zhao – Hefei University of Technology

  • 11:30 AM – 1:30 PM ET
    Leakage Current Detection Scheme for Aging Test of 10kV SiC MOSFET Power Module

    Technical Dialogue Presenter: Peiyang Ding – Xi’an Jiaotong University

    Co-Author: Hong Zhang – Xi’an Jiaotong University

    Co-Author: Tianshu Yuan – Xi’an Jiaotong University

    Co-Author: Qiling Chen – Xi’an Jiaotong University

    Co-Author: Jiacheng Guo – Xi’an Jiaotong University

    Co-Author: Dingkun Ma – Xi’an Jiaotong University

    Co-Author: Peiyuan Sun, BE – Xi'an Jiaotong University

    Co-Author: Laili Wang, PhD – Xi'an Jiaotong University

    Co-Author: Ting Hou – China Southern Power Grid Electric Power Research Institute

  • 11:30 AM – 1:30 PM ET
    Physics-Informed Neural Network Approach for Early Degradation Trajectory Prediction of Power Semiconductor Modules

    Technical Dialogue Presenter: Jie Kong, PhD student – Aalborg University

    Co-Author: Yi Zhang – Aalborg University

    Co-Author: Yichi Zhang, PhD (he/him/his) – Aalborg University

    Co-Author: Lukas Wick – Neurospace

    Co-Author: Frederik Lillebæk Hansen – Neurospace

    Co-Author: Dao Zhou – Aalborg University

    Co-Author: Huai Wang – Aalborg University

  • 11:30 AM – 1:30 PM ET
    Nonlinear Output Capacitance of Bidirectional Gallium Nitride Power Switches

    Technical Dialogue Presenter: Michael Bosch – University of Stuttgart

    Co-Author: Dominik Koch, MA – University of Stuttgart

    Co-Author: Jeremy Nuzzo – University of Stuttgart

    Co-Author: Mathias Weiser – University of Stuttgart

    Co-Author: Ingmar Kallfass – University of Stuttgart