Efficient Power Conversion
Dr. Shengke Zhang is Vice President of Product Reliability at EPC, where he leads the conduction of reliability testing and failure analyses for all GaN transistors and ICs. Prior to joining EPC, he worked as Sr. Failure Analysis Engineer on RF-MEMS devices in the mobile industry. He earned his Ph.D. degree in Materials Science and Engineering from Arizona State University, investigating low-loss dielectrics for cellular and quantum computing applications. He received his B.S. degree from Huazhong University of Science and Technology. He was the author and co-author of more than 40 technical papers. He is also a committee member for JEDEC's JC-70 Wide Bandgap Power Electronic Conversion Semiconductors Committee.
T04.7 - Development and Validation of Repetitive Transient Gate Overvoltage Rating for GaN HEMTs
Tuesday, March 18, 2025
11:00 AM – 11:20 AM ET