Xi’an Jiaotong University
Peiyang Ding was born in Tongchuan, China. He received the B.S. degree in electrical engineering from Harbin Institute of Technology, Harbin, China, in 2023. He is currently pursuing the M.S. degree in electronic and electrical engineering with Xi’an Jiaotong University, Xi’an, China. His research interests include the packaging and reliability of high-voltage power semiconductor modules.
D07.7 - Leakage Current Detection Scheme for Aging Test of 10kV SiC MOSFET Power Module
Thursday, March 20, 2025
11:30 AM – 1:30 PM ET