Ho-Tin Tang

City University of Hong Kong

Ho-Tin Tang (S’18) received the B.Eng. (Hons) degree in computer engineering, in 2015, from City University of Hong Kong, Kowloon, Hong Kong, where he is currently working toward the Ph.D. degree with the Department of Electrical Engineering.
His current research interests include gate driver design, wide-bandgap device’s reliability, real-time fault diagnosis, and the development of nondestructive testing facilities.

Presentation(s):

• T27.3 - A Novel Non-Intrusive Online Monitoring Method for Diagnosing the Lift-Off of Bonding Wires in SiC MOSFETs

  Thursday, March 20, 2025
  8:40 AM – 9:00 AM ET

• T29.4 - Use of Switched-Capacitor Circuit to Generate Negative Gate-Source Voltage Pulses

  Thursday, March 20, 2025
  9:00 AM – 9:20 AM ET