City University of Hong Kong
T19.7 - A Fast Short-Circuit Protection Method for Ohmic Gate P-GaN HEMT based on Gate Charge
Wednesday, March 19, 20254:00 PM – 4:20 PM ET
T27.3 - A Novel Non-Intrusive Online Monitoring Method for Diagnosing the Lift-Off of Bonding Wires in SiC MOSFETs
Thursday, March 20, 20258:40 AM – 9:00 AM ET