Stéphane Azzopardi

Safran Tech, Safran

Presentation(s):

• D14.1 - A Highly Integrable, Modular and Multi-Functional Fault Monitoring Active Gate Driver with Parallel Buffers for a Global Enhanced Reliability of Gen. 3 SiC Power MOSFETs

  Monday, March 17, 2025
  12:00 PM – 1:30 PM ET

• D14.1 - A Highly Integrable, Modular and Multi-Functional Fault Monitoring Active Gate Driver with Parallel Buffers for a Global Enhanced Reliability of Gen. 3 SiC Power MOSFETs

  Thursday, March 20, 2025
  11:30 AM – 1:30 PM ET