Ryo Takeda, MSEE

Keysight Technologies

Ryo Takeda is a solution architect at Automotive and Energy Solutions of Keysight Technologies. After joining Hewlett-Packard in 1989, he worked as an application development engineer and manager for semiconductor parametric test instruments for more than 10 years. Since moving over into product planning, he has guided Agilent’s power device analyzer product definition and performed activities that include market research, business planning and product management. He is currently working on the definition and development of dynamic test system for power devices. He is a member of JEDEC WBG (Wide Band Gap) Working Group. He holds a BSEE and MSEE from Keio University (Japan) in the area of semiconductor device physics.

Presentation(s):

• D16.2 - Scattering Parameter Measurement System using Probes for Surface Mount Devices Operating in the Frequency Range from 50 kHz to 1 GHz

  Thursday, March 20, 2025
  11:30 AM – 1:30 PM ET

• IS26.4 - Dynamic characterization of a WBG power semiconductor bare chip

  Thursday, March 20, 2025
  11:25 AM – 11:50 AM ET