Texas Instruments
Sandeep Bahl is a Distinguished Member of Technical Staff at Texas Instruments. He has worked on both Si and GaN technologies. His work in application reliability has led to both increased market adoption for the GaN industry and reliable GaN products for TI. He co-invented the direct-drive architecture used in TI GaN products and led their reliable release. Sandeep is co-chair of the JEDEC JC70 GaN reliability task group and led the first JEDEC GaN reliability guideline, JEP180. Sandeep graduated with a PhD in Electrical Engineering from the Massachusetts Institute of Technology.
Wednesday, March 19, 2025
1:30 PM – 1:55 PM ET