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Technical Lecture
Technical Lecture Session

T18 - GaN & SiC Power Devices

Wednesday, March 19, 2025
1:30 PM – 5:00 PM ET
Location: Level Three, A302

Presentations:

  • 1:30 PM – 1:50 PM ET
    First Characterization of GaN Power Device and IC at Deep Cryogenic Temperatures Down to 100 mK

    Technical Lecture Presenter: Qihao Song – Virginia Tech

    Co-Author: Xin Yang – Center for Power Electroncis Systems, Virginia Tech

    Co-Author: Yuhao Zhang – Virginia Polytechnic Institute and State University

    Co-Author: Matthew Porter – Center for Power Electroncis Systems, Virginia Tech

    Co-Author: Zineng Yang – Center for Power Electroncis Systems, Virginia Tech

    Co-Author: Zichen Xi – Bradley Department of Electrical and Computer Engineering, Virginia Tech

    Co-Author: Linbo Shao – Bradley Department of Electrical and Computer Engineering, Virginia Tech

    Co-Author: Liyan Zhu – Virginia Tech Center for Power Electronics Systems

    Co-Author: Liyang Jin – Bradley Department of Electrical and Computer Engineering, Virginia Tech

  • 1:50 PM – 2:10 PM ET
    Dynamic Environment-Aware Lifetime Prediction of SiC MOSFET Modules Through LSTM

    Technical Lecture Presenter: Md Zakir Hasan (he/him/his) – Mississippi State University

    Co-Author: Seungdeog Choi – Mississippi State University

    Co-Author: Prashant Singh – University of Tennessee - Knoxville

    Co-Author: Chun-Hung Liu – Mississippi state university

    Co-Author: Youssef Aider – University of Tennessee - Knoxville

  • 2:10 PM – 2:30 PM ET
    Guarding-Based C-V Characterization of 10 kV SiC MOSFET in Half-Bridge Module Configuration

    Technical Lecture Presenter: Nianzun Qi – Aalborg University

    Co-Author: Gao Liu – Aalborg University

    Co-Author: Zhixing Yan – Aalborg University

    Co-Author: Shaokang Luan – Aalborg University

    Co-Author: Pawel Piotr Kubulus – Aalborg University

    Co-Author: Yuan Gao, PhD – Aalborg University

    Co-Author: Stefan Meyer – Aalborg University

    Co-Author: Asger Bjørn Jørgense – Aalborg University

    Co-Author: Hongbo Zhao – AAU Energy

    Co-Author: Stig Munk-Nielsen – Aalborg University

  • 2:30 PM – 2:50 PM ET
    Automated Characterization Platform for Comprehensive Dynamic Rdson Assessment of GaN HEMTs from 50 K to 400 K

    Technical Lecture Presenter: Tian Qiu (he/him/his) – Rensselaer Polytechnic Institute

    Co-Author: Zheyu Zhang – RPI

    Co-Author: Purushottam Khadka – RPI

    Co-Author: Ahmed Siraj – Rensselaer Polytechnic Institute

    Co-Author: Dilip Rana – Rensselaer Polytechnic Institute

  • 2:50 PM – 3:10 PM ET
    A Gate Driving Scheme for GaN Git with Enhanced Short Circuit Capability for Motor Drive Application

    Technical Lecture Presenter: Zhenchao Li (he/him/his) – EPFL

    Co-Author: Zongjie Zhou (he/him/his) – The Hong Kong University of Science and Technology

    Co-Author: Yan Cheng – The Hong Kong University of Science and Technology

    Co-Author: Kevin Jing Chen – The Hong Kong University of Science and Technology

  • 3:40 PM – 4:00 PM ET
    Online Detection and Reduction of the Influence of Parameter Tolerance of Paralleled SiC MOSFETs in an EV Inverter Environment

    Technical Lecture Presenter: Hadiuzzaman Syed – Robert Bosch GmbH

    Co-Author: Jochen Streit – Robert Bosch GmbH

    Co-Author: Robert Kragl – Robert Bosch GmbH

    Co-Author: Muhammad Muneeb Alam, Masters of Science in Electrical Power Engineering (he/him/his) – Robert Bosch GmbH

    Co-Author: Karl Oberdieck – Robert Bosch GmbH

    Co-Author: Ertuğrul Sönmez – Reutlingen University

    Co-Author: Alberto Martinez-Limia – Robert Bosch GmbH

  • 4:00 PM – 4:20 PM ET
    Dynamic Current Sharing Issues with Paralleling SiC Power MOSFETs

    Technical Lecture Presenter: Ching-Yao Liu – National Yang-Ming Chiao-Tung University

    Co-Author: Chen-Chan Lee – National Taiwan University

    Co-Author: Jih-Sheng Lai – Virginia Polytechnic Institute and State University

  • 4:20 PM – 4:40 PM ET
    Integrated Short-Circuit Protection Design based on Dual-Channel Gate Driver for Series Connected Medium-Voltage SiC MOSFETs

    Technical Lecture Presenter: Rui Wang – École polytechnique fédérale de Lausanne

    Co-Author: Drazen Dujic – Power Electronics Laboratory, EPFL

  • 4:40 PM – 5:00 PM ET
    Long-Term High-Temperature Dynamic Gate Stress Reliability of a Last-Generation, Automotive-Grade, Planar 1200 V SiC MOSFET

    Technical Lecture Presenter: Giuseppe Mauromicale, PhD (he/him/his) – STMicroelectronics

    Co-Author: Alessandro Sitta – STMicroelectronics

    Co-Author: Michele Fiore – STMicroelectronics

    Co-Author: Michele Calabretta (he/him/his) – STMicroelectronics

    Co-Author: Francesco Iannuzzo – Aalborg University