The double pulse test (DPT) is a widely accepted method to evaluate the dynamic performance of power devices. However, the results are accurate only if the DPT setup emulates the commutation loop. This paper presents an overview of DPT methods for three-phase two-level voltage source, two-level current source, and direct matrix converter applications. The impact of switching V-I timing alignment on the testing results is discussed, and a V-I alignment approach is introduced for all the DPT systems. A 1.2 kV/15 A SiC-based DPT presents the results for the three configurations. The impact of parasitic capacitances on the switching losses and the methods to minimize the impact on the DPT results are finally presented.
