As power electronics evolve, many designers are making the shift from silicon (Si) to silicon carbide (SiC) to take advantage of higher efficiency, faster switching speeds, and improved thermal performance. However, this transition also introduces new design and testing challenges, including high-speed signal integrity, EMI concerns, and the need for precise high-voltage measurements.
In this session, experts from Wolfspeed, PE Systems and Tektronix will explore critical considerations for successfully integrating SiC into your designs. Through real-world measurement demonstrations, we’ll highlight common pitfalls, best practices, and advanced testing solutions—such as Tektronix’s IsoVu™ isolated probe technology—ensuring accurate, high-fidelity validation of SiC-based power systems. Whether you're designing for increased power density, lower losses, or enhanced system reliability, this session will equip you with the insights needed to optimize your SiC testing strategy.
