Michele Calabretta (he/him/his)

STMicroelectronics

Michele Calabretta received the M.S. degree in mechanical engineering and the Ph.D. degree in mathematics applied to engineering from the University of Catania, Catania, Italy, in 2005 and 2009, respectively.
From 2005 to 2008, he was a Research and Development Engineer with Ferrari S.p.A, Maranello, Italy. From 2008 to 2011, he was a Simulation Team Leader with Automobili Lamborghini, Sant’Agata Bolognese, Italy. He has been involved in design and multi-physics simulation (CAD/CAE) and material characterization. Since 2011, he has been with STMicroelectronics, Catania, where he is currently acting as "Advanced Reliablity & Physical Analysis Director" for the Quality, Manufacturing & Technology (QMT) Research and Development Department. His research interests include semiconductor technologies and reliability aspects, physical analysis, lifetime modeling, and multi-physics simulations.

Presentation(s):

• T18.9 - Long-Term High-Temperature Dynamic Gate Stress Reliability of a Last-Generation, Automotive-Grade, Planar 1200 V SiC MOSFET

  Wednesday, March 19, 2025
  4:40 PM – 5:00 PM ET

• IS19.7 - AI applied to Diagnostic and Monitoring of Power Modules for Traction inverter

  Thursday, March 20, 2025
  11:00 AM – 11:25 AM ET