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Joint GaN Technology Study (IS06.4)
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Elona Lala, MS Electrical Engineer (she/her/hers) – IBM ### 2511874###Industry Session Presenter###Supply Chain Engineering###IBM###
Industry Session Presenter: Elona Lala, MS Electrical Engineer (she/her/hers) – IBM
### she/her/hers IS06.4
Junction Temperature Monitoring of GaN HEMT by using On-Resistance with Voltage Clamp and Current Shunt (T04.8)
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Xiao Wang (he/him/his) – ChongQing university ### 2503089###Technical Lecture Presenter###Undergraduate Student###ChongQing university###
Technical Lecture Presenter: Xiao Wang (he/him/his) – ChongQing university
### he/him/his @@@ Mingrui Zou (he/him/his) – ChongQing university ### 2509721###Co-Author###Ph.D student###ChongQing university###
Co-Author: Mingrui Zou (he/him/his) – ChongQing university
### he/him/his @@@ Jiakun Gong – ChongQing university ### 2509722###Co-Author###174 Shazheng St., Shapingba, Chongqing, China###ChongQing university###
Co-Author: Jiakun Gong – ChongQing university
### @@@ Yulei Wang (he/him/his) – Chongqing University ### 2509723###Co-Author###Ph.D. Student###Chongqing University###
Co-Author: Yulei Wang (he/him/his) – Chongqing University
### he/him/his @@@ Zheng Zeng – ChongQing university ### 2509724###Co-Author###Professor###ChongQing university###
Co-Author: Zheng Zeng – ChongQing university
### T04.8